SN74BCT8374ADWR especificación: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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SN74BCT8374ADWR Datasheet y Espec

Fabricante : TI

Embalaje : DW

Pins : 24

Temperatura : Min 0 °C | Max 70 °C

Tamaño : 323 KB

Aplicación : SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS