SNJ54ABT8543JT similares

  • SNJ5400J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400WA
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5401J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5401W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402W
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SNJ54ABT8543JT Datasheet y Espec

Fabricante : TI 

Embalaje : JT 

Pins : 28 

Temperatura : Min -55 °C | Max 125 °C

Tamaño : 392 KB

Aplicación : SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS 

SNJ54ABT8543JT PDF Download

SNJ54ABT8543JT PDF