Path:OKDatasheet > Datasheet Semiconductor > TI Datasheet > SNJ54BCT8373AFK
SNJ54BCT8373AFK especificación: SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
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SNJ54BCT8373AFK Datasheet y Espec
Fabricante : TI
Embalaje : FK
Pins : 28
Temperatura : Min -55 °C | Max 125 °C
Tamaño : 323 KB
Aplicación : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SNJ54BCT8373AFK PDF Download
