Path:OKDatasheet > Datasheet Semiconductor > TI Datasheet > SN74BCT8244ADW
SN74BCT8244ADW especificación: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS
Path:OKDatasheet > Datasheet Semiconductor > TI Datasheet > SN74BCT8244ADW
SN74BCT8244ADW especificación: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS
Fabricante : TI
Embalaje : DW
Pins : 24
Temperatura : Min 0 °C | Max 70 °C
Tamaño : 322 KB
Aplicación : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS